9 results
Combined EELS and Cathodoluminescence analysis in a STEM microscope of GaN / InGaN quantum wells for LED applications
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1259-1260
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Recent Advances in EELS Instrumentation and Analysis: Spectroscopy and Filtered Imaging with Extended Energy, Temporal, and Dynamic Range
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 42-43
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
High-Speed, Hardware-Synchronized STEM EELS Spectrum-Imaging Using a Next Generation Post-Column Imaging Filter
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 126-127
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
High Order Aberration Correction in a Post-Column Energy Filter
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 56-57
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
4D STEM/EELS Characterization of Au Nanodots in a ZnO Thin Film
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 424-425
- Print publication:
- August 2008
-
- Article
- Export citation
Acquisition of Combined Real/Reciprocal Space Multi-Dimensional Datasets
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 778-779
- Print publication:
- August 2008
-
- Article
- Export citation
The Newly Installed Aberration Corrected and Dedicated STEM (Hitachi HD2700C) at Brookhaven National Laboratory
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1374-1375
- Print publication:
- August 2008
-
- Article
- Export citation
Elemental Mapping in Three Dimensions using 4D STEM-EELS Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1384-1385
- Print publication:
- August 2008
-
- Article
- Export citation
Moving Beyond Bright Field Transmission Electron Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1320-1321
- Print publication:
- August 2007
-
- Article
- Export citation