7 results
In-Situ UHV Electromigration In Cu Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 427 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 83
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- 1996
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In-Situ UHV Electromigration in CU Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 428 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 31
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- 1996
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In-Situ TEM Observation of Electromigration Damage by Surface or Interface Diffusion in Al and Al Alloy Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 225 / 1991
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- 15 February 2011, 125
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- 1991
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The Kinetics of Electromigration Damage in Copper Films Studied by Isothermal Resistance Change Analysis
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- Journal:
- MRS Online Proceedings Library Archive / Volume 225 / 1991
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- 15 February 2011, 119
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- 1991
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Thermally induced hillock formation in Al–Cu films
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- Journal:
- Journal of Materials Research / Volume 4 / Issue 5 / October 1989
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1172-1181
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- October 1989
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Thin Film Growth
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- Journal:
- MRS Online Proceedings Library Archive / Volume 103 / 1987
- Published online by Cambridge University Press:
- 25 February 2011, 3
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- 1987
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Limited Reaction Processing: Silicon and III–V Materials
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- Journal:
- MRS Online Proceedings Library Archive / Volume 92 / 1987
- Published online by Cambridge University Press:
- 28 February 2011, 281
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- 1987
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