A new laboratory apparatus devoted to the characterization of various
devices for the X-UV range (100–5000 eV), such as mirrors, diffraction
gratings, spectrometers or detectors is described. The apparatus includes
open X-ray tubes as X-ray sources, a two-crystal monochromator for
wavelength selection and a goniometer. Various examples of its use are
presented: dispersive mode where the radiation coming from the X-ray tube
is dispersed by the two-crystal monochromator, spectrometric mode where the
goniometer is used as a plane X-ray spectrometer and reflectometric mode
where a selected wavelength is used to perform absolute reflectivity
measurements.