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MONOX: a characterization tool for the X-UV range

Published online by Cambridge University Press:  18 August 2005

J.-M. André ,
A. Avila ,
R. Barchewitz ,
R. Benbalagh ,
R. Delaunay ,
D. Druart ,
P. Jonnard  and
H. Ringuenet
J.-M. André*
Affiliation:
Laboratoire de Chimie Physique-Matière et Rayonnement, Université Pierre et Marie Curie, UMR/CNRS 7614, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
A. Avila
Affiliation:
Laboratoire de Chimie Physique-Matière et Rayonnement, Université Pierre et Marie Curie, UMR/CNRS 7614, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
R. Barchewitz
Affiliation:
Laboratoire de Chimie Physique-Matière et Rayonnement, Université Pierre et Marie Curie, UMR/CNRS 7614, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
R. Benbalagh
Affiliation:
Laboratoire de Chimie Physique-Matière et Rayonnement, Université Pierre et Marie Curie, UMR/CNRS 7614, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
R. Delaunay
Affiliation:
Laboratoire de Chimie Physique-Matière et Rayonnement, Université Pierre et Marie Curie, UMR/CNRS 7614, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
D. Druart
Affiliation:
Laboratoire de Chimie Physique-Matière et Rayonnement, Université Pierre et Marie Curie, UMR/CNRS 7614, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
P. Jonnard
Affiliation:
Laboratoire de Chimie Physique-Matière et Rayonnement, Université Pierre et Marie Curie, UMR/CNRS 7614, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
H. Ringuenet
Affiliation:
Laboratoire de Chimie Physique-Matière et Rayonnement, Université Pierre et Marie Curie, UMR/CNRS 7614, 11 rue Pierre et Marie Curie, 75231 Paris Cedex 05, France
*
andrejm@ccr.jussieu.frjonnard@ccr.jussieu.fr
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Abstract

A new laboratory apparatus devoted to the characterization of various devices for the X-UV range (100–5000 eV), such as mirrors, diffraction gratings, spectrometers or detectors is described. The apparatus includes open X-ray tubes as X-ray sources, a two-crystal monochromator for wavelength selection and a goniometer. Various examples of its use are presented: dispersive mode where the radiation coming from the X-ray tube is dispersed by the two-crystal monochromator, spectrometric mode where the goniometer is used as a plane X-ray spectrometer and reflectometric mode where a selected wavelength is used to perform absolute reflectivity measurements.

Keywords

Type
Research Article
Information
The European Physical Journal - Applied Physics , Volume 31 , Issue 2 , August 2005 , pp. 147 - 152
Copyright
© EDP Sciences, 2005

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References

D. Attwood, Soft X-rays and Extreme Ultraviolet Radiation, Principles and Applications (Cambridge University Press, Cambridge, 1999)
Y. Cauchois, C. Sénemaud, Tables Internationales des Constantes Sélectionnées “Longueurs d'Onde des Émissions X et des Discontinuités d'Absorption” (Pergamon Press, Oxford, 1978)
Golovchenko, J.A., Levesque, R.A., Cowan, P.L., Rev. Sci. Instrum. 52, 509 (1981) CrossRef
Michaelsen, C., Wiesmann, J., Bormann, R., Nowak, C., Dieker, C., Hollensteiner, S., Jäger, W., Opt. Lett. 26, 792 (2001) CrossRef
Kefi, M., Jonnard, P., Vergand, F., Bonnelle, C., Gillet, E., J. Phys.-Cond. Matter 5, 8629 (1993) CrossRef
A. Sammar, J.-M. André, M. Ouahabi, B. Pardo, R. Barchewitz, C.R. Acad Sci. Paris 315, Série II, 1055 (1993)
André, J.-M., Benbalagh, R., Barchewitz, R., Ravet, M.-F., Raynal, A., Delmotte, F., Bridou, F., Julié, G., Bosseboeuf, A., Laval, R., Soullié, G., Rémond, C., Fialin, M., X-ray Spectrom. 30, 212 (2001) CrossRef
Benbalagh, R., André, J.-M., Barchewitz, R., Ravet, M.-F., Raynal, A., Delmotte, F., Bridou, F., Julié, G., Bosseboeuf, A., Laval, R., Soullié, G., Rémond, C., Fialin, M., Appl. Optics 41, 239 (2002)
Burek, A., Space Sci. Instrum. 2, 53 (1976)
André, J.-M., Maquet, A., Barchewitz, R., Phys. Rev. B 25, 5671 (1982) CrossRef
André, J.-M., Barchewitz, R., Maquet, A., Marmoret, R., Phys. Rev. B 30, 12 (1984)
Filatova, E.O., Blagoveshchenskaya, T.A., J. X-Ray Sci. Technol. 4, 1 (1983) CrossRef
Blagoveschchenskaya, T.A., Filatova, E.O., Sov. Tech. Phys. Lett. 17, 428 (1991)
Y. Shvyd'ko, X-Ray Optics, High-Energy-Resolution Applications (Springer-Verlag, 2004), p. 151
P. Jonnard, J. Phys. IV Colloq. France 8, Pr9-33 (1998)
Jonnard, P., André, J.-M., Gautier, J., Roulliay, M., Bridou, F., Delmotte, F., Ravet, M.-F., J. Phys. IV Colloq. France 118, 231 (2004) CrossRef
Wyon, C., Nucl. Instrum. Meth. Res. Phys. B 186, 380 (2002)