5 results
Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue 5 / October 2008
- Published online by Cambridge University Press:
- 16 September 2008, pp. 469-477
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- October 2008
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First performance measurements and application results of a new high brightness Schottky field emitter for HR-S/TEM at 80-300kV acceleration voltage
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1370-1371
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- August 2008
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0.60 eV Energy Resolution in EELS Using a Depleted Thermionic LaB6-Cathode
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 712-713
- Print publication:
- August 2005
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Design of an Analytical TEM/STEM with 0.3 srad EDX Detection
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 704-705
- Print publication:
- August 2005
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First experimental proof of spatial resolution improvement in a monochromized and Cs-corrected TEM
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- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue S03 / August 2004
- Published online by Cambridge University Press:
- 01 August 2004, pp. 4-5
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- August 2004
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