4 results
Development of Variable Temperature Scanning Microwave Microscope for High Throughput Materials Characterization
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- Journal:
- MRS Online Proceedings Library Archive / Volume 894 / 2005
- Published online by Cambridge University Press:
- 26 February 2011, 0894-LL02-03
- Print publication:
- 2005
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The Development of Scanning Microwave Microscope for High-Throughput Characterization of Dielectric and Conducting Materials at Low Temperatures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 804 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, JJ9.21
- Print publication:
- 2003
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Airplane and Drop Experiments on Crystallization of InxGa1-xSb Semiconductor under Different Gravity Conditions
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- Journal:
- MRS Online Proceedings Library Archive / Volume 692 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, H9.24.1
- Print publication:
- 2001
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Airplane and Drop Experiments on Crystallization of InxGa1−xSb Semiconductor under Different Gravity Conditions
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- Journal:
- MRS Online Proceedings Library Archive / Volume 692 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, H11.1.1
- Print publication:
- 2001
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