6 results
Precession Electron Diffraction (PED) Strain Measurements in Stacked Nanosheet Structures
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2018-2019
- Print publication:
- August 2019
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Nanobeam Diffraction and Geometric Phase Analysis for Strain Measurements in Si/SiGe Nanosheet Structures
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1528-1529
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- July 2016
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Elastic Relaxation of Strained Silicon on Insulator (sSOI) Fins: Nanobeam Diffraction (NBD) and Simulations
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1967-1968
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- August 2015
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Strain Quantification Analysis of Epitaxial SiGe on SOI by Nanobeam Diffraction (NBD)
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1070-1071
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- August 2014
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Measurement of the loss tangent of low-density polyethylene with a nanoindentation technique
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- Journal:
- Journal of Materials Research / Volume 15 / Issue 5 / May 2000
- Published online by Cambridge University Press:
- 31 January 2011, pp. 1195-1198
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- May 2000
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Time Dependent Deformation During Indentation Testing
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- Journal:
- MRS Online Proceedings Library Archive / Volume 436 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 233
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- 1996
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