5 results
Resistive Switching Behavior and Electrical Properties of TiO2:Ho2O3 and HoTiOx Based MIM Capacitors
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1691 / 2014
- Published online by Cambridge University Press:
- 17 June 2014, mrss14-1691-bb10-10
- Print publication:
- 2014
-
- Article
- Export citation
Liquid injection MOCVD and ALD studies of “single source” Sr-Nb and Sr-Ta precursors
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 784 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, C4.1
- Print publication:
- 2003
-
- Article
- Export citation
On the interface quality of MIS structures fabricated from Atomic Layer Deposition of HfO2, Ta2O5 and Nb2O5−Ta2O5−Nb2O5 dielectric thin films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 786 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E3.18
- Print publication:
- 2003
-
- Article
- Export citation
Emanation thermal analysis in the characterization of zinc sulfide thin films prepared from different precursors
-
- Journal:
- Journal of Materials Research / Volume 9 / Issue 1 / January 1994
- Published online by Cambridge University Press:
- 03 March 2011, pp. 119-124
- Print publication:
- January 1994
-
- Article
- Export citation
Growth of SrS Thin Films by Atomic Layer Epitaxy
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 222 / 1991
- Published online by Cambridge University Press:
- 16 February 2011, 315
- Print publication:
- 1991
-
- Article
- Export citation