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Tip Induced Surface Defect migration and Conductivity Studies in Tetragonal, Rhombohedral and Mixed-Phase epitaxial BiFeO3 Thin Films
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- Journal:
- MRS Advances / Volume 3 / Issue 44 / 2018
- Published online by Cambridge University Press:
- 24 May 2018, pp. 2713-2718
- Print publication:
- 2018
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- Article
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