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Tip Induced Surface Defect migration and Conductivity Studies in Tetragonal, Rhombohedral and Mixed-Phase epitaxial BiFeO3 Thin Films

Published online by Cambridge University Press:  24 May 2018

M M Saj Mohan ,
M V Sreenath  and
Ranjith Ramadurai
M M Saj Mohan*
Affiliation:
Department of Materials Science and Metallurgical Engineering, IIT Hyderabad, Sangareddy, Kandi, Telangana, India-502285.
M V Sreenath
Affiliation:
Department of Materials Science and Metallurgical Engineering, IIT Hyderabad, Sangareddy, Kandi, Telangana, India-502285.
Ranjith Ramadurai
Affiliation:
Department of Materials Science and Metallurgical Engineering, IIT Hyderabad, Sangareddy, Kandi, Telangana, India-502285.
*
*(Email: ms13p1006@iith.ac.in)
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Abstract

BiFeO3 (BFO) is the most studied room temperature multiferroic compound. In this work we demonstrate a template assisted growth process through which the growth strain is controlled to achieve required phase of BFO. Growth of (∼20nm) fully strained tetragonal (T), rhombohedral (R) and mixed phase of T and R of Bismuth ferrite (BiFeO3) was achieved by varying the thickness of the template layer. The different phases were confirmed by using high resolution x-ray diffractions studies. The conductivity map of all the three phases were carried out using an atomic force microscope operating in conductive mode. Tip induced surface defect migration within a given grain was observed in pure phases and the conductivity map confirmed the same. The room temperature resistivity is found to be decreasing systematically from 1.1×106 Ωm , 935×105 Ωm and 1.16×104 Ωm respectively for tetragonal, mixed phase and rhombohedral phase BFO. In the case of mixed phase both the nano- scale and macroscopic leakage current studies show low conductivity, which could be due to the increased pinning sites that increases the energy barrier for the defect migration. The local nano-scale measurements and conductivity mapping corroborates well with the macroscopic studies.

Keywords

ferroelectricepitaxythin filmscanning probe microscopy (SPM)
Type
Articles
Information
MRS Advances , Volume 3 , Issue 44: Characterization, Modeling and Theory , 2018 , pp. 2713 - 2718
Copyright
Copyright © Materials Research Society 2018 

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References

REFERENCES

Catalan, G., and Scott, J. F., Adv. Mater., 21, 2463–2485 (2009).CrossRefGoogle Scholar
Wang, J., Neaton, J.B., Zheng, H., Nagarajan, V., Ogale, S.B., Liu, B., Viehland, D., Vaithyanathan, V., Schlom, D.G., V Waghmare, U., Spaldin, N.A., Rabe, K.M., Wuttig, M. and Ramesh, R., Science. 299, 1719–1722 (2003).CrossRefGoogle Scholar
Christen, H.M., Nam, J.H., Kim, H.S., Hatt, A.J. and Spaldin, N.A.,, Phys. Rev B. 83, 144107 (2011).CrossRefGoogle Scholar
Zeches, R.J., Rossell, M.D., Zhang, J.X., Hatt, A.J., He, Q., Yang, C.-H., Kumar, A., Wang, C.H., Melville, A., Adamo, C., Sheng, G., Chu, Y.-H., Ihlefeld, J.F., Erni, R., Ederer, C., Gopalan, V., Chen, L.Q., Schlom, D.G., Spaldin, N.A., Martin, L.W., and Ramesh, R., Science. 326 ,977 (2009).CrossRefGoogle Scholar
Shin, Y.J., Jeon, B.C., Yang, S.M., Hwang, I., Cho, M.R., Sando, D., Lee, S.R., Yoon, J.-G., and Noh, T.W., Sci. Rep. 5, 10485 (2015).CrossRefGoogle Scholar
Saj Mohan, M.M., Ramadurai, R. “Template Assisted Strain Tuning and Phase Stabilization in Epitaxial BiFeO3 Thin Films “ AIP conference proceedings presented at DAE SSPS 2017(under review).Google Scholar
Ionescu-Zanetti, C., and Mechler, A., European Microscopy and Analysis. 19, 9–11 (2005).Google Scholar
Shen, X., Yin, K., Puzyrev, Y.S., Liu, Y., Sun, L., Li, R.-W., and Pantelides, S.T., Adv. Electron. Mat. 1, 1500019 (2015).CrossRefGoogle Scholar
Jyotsna, S., Arora, A., Sekhon, J.S., and Sheet, G., J. Appl. Phy.10, 116 (2014).Google Scholar
Ranjith, R, Prellier, W., Cheah, J., Wang, J., and Wu, T., Appl. Phys. Lett. 92, 232905 (2008).CrossRefGoogle Scholar