3 results
Improvements in Low Voltage PFIB for Sample Preparation and Large Volume Serial Sectioning Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 898-899
- Print publication:
- August 2020
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O+ PFIB Milling and Measurement of FIB Damage in Silicon
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- Journal:
- Microscopy and Microanalysis / Volume 26 / Issue S2 / August 2020
- Published online by Cambridge University Press:
- 30 July 2020, pp. 414-415
- Print publication:
- August 2020
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Three-Dimensional in situ Reconstructions of Microstructures with Bimodal Grain Size Distributions
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 370-371
- Print publication:
- August 2019
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