7 results
Protective Carbon Deposition for Superior FIB Prepared (S)TEM Specimens
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 336-337
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- July 2009
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Contrast Mechanisms in Ga+ Ion Induced Secondary Electron Images
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 650-651
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- July 2009
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30 keV Ga+ FIB Induced X-Rays (FIBIX) of Conductive Materials
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 478-479
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- July 2009
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Advances in TEM Sample Preparation Using a Focused Ion Beam
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 380-381
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- August 2008
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Relative Contrast in Ion and Electron Induced Secondary Electron Images
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1188-1189
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- August 2008
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Circumferential FIB Milling for Lift-Out Specimens
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1310-1311
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- August 2006
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Reducing FIB Damage Using Low Energy Ions
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1260-1261
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- August 2006
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