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Focused Electron Beam Induced Deposition of High Resolution Magnetic Scanning Probe Tips
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- Journal:
- MRS Online Proceedings Library Archive / Volume 706 / 2001
- Published online by Cambridge University Press:
- 15 March 2011, Z9.24.1
- Print publication:
- 2001
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- Article
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From Point Defects to Amorphous Structures: Atomic Resolution Studies of Semiconductor Surfaces by Scanning Tunneling Microscopy (STM)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 183 / 1990
- Published online by Cambridge University Press:
- 21 February 2011, 237
- Print publication:
- 1990
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- Article
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