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Electromigration Testing of via Terminated Test Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 563 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 133
- Print publication:
- 1999
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Evaluation of Current Ramp Test for In-Line Electromigration Test
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- Journal:
- MRS Online Proceedings Library Archive / Volume 563 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 127
- Print publication:
- 1999
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Reliability Studies of Cu using Wafer Level Joule Heated Electromigration Test
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- Journal:
- MRS Online Proceedings Library Archive / Volume 564 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 365
- Print publication:
- 1999
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