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Using a Plasma FIB Equipped with Xe, N2, O2 and Ar for Atom Probe Sample Preparation – Ion Implantation and Success Rates
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 316-317
- Print publication:
- August 2019
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- Article
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Correlative UHV-Cryo Transfer Suite: Connecting Atom Probe, SEM-FIB, Transmission Electron Microscopy via an Environmentally-Controlled Glovebox
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 2494-2495
- Print publication:
- August 2019
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- Article
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- You have access
- Export citation