7 results
Analytical STEM Study of P-Doped Silicon Nanocrystals Exhibiting Mid-Infrared Localized Surface Plasmon Resonance
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1508-1509
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- August 2013
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Electron Beam Channeling in Single Atomic Column
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 604-605
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- August 2013
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The Contribution of Back Stress to Strength in Nanomaterials
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 522-523
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- August 2013
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In-Situ TEM Compression of MgO Nanocubes
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 524-525
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- August 2013
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Effects of Charge Transfer in Atomic Bonding on HAADF-STEM Image Simulation
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 602-603
- Print publication:
- August 2013
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Investigation of Secondary Hardening in MP35N Wires
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1778-1779
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- August 2013
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Determination of the Width of the GaN/AlxGa1-xN Heterointerface Using EELS
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- Journal:
- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 216-217
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- August 2001
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