Hostname: page-component-848d4c4894-hfldf Total loading time: 0 Render date: 2024-06-01T21:49:30.863Z Has data issue: false hasContentIssue false
  • English
  • Français

Analytical STEM Study of P-Doped Silicon Nanocrystals Exhibiting Mid-Infrared Localized Surface Plasmon Resonance

Published online by Cambridge University Press:  09 October 2013

J.S. Jeong ,
D.J. Rowe ,
U.R. Kortshagen  and
K.A. Mkhoyan
J.S. Jeong
Affiliation:
D.J. Rowe
Affiliation:
U.R. Kortshagen
Affiliation:
K.A. Mkhoyan
Affiliation:

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 19 , Issue S2: Proceedings of Microscopy & Microanalysis 2013 , August 2013 , pp. 1508 - 1509
Copyright
Copyright © Microscopy Society of America 2013