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Size effects of micrometer-scaled metals—the search continues for materials containing real microstructures
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- Journal:
- MRS Communications / Volume 7 / Issue 2 / June 2017
- Published online by Cambridge University Press:
- 09 April 2017, pp. 131-140
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- June 2017
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Contributors
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- Book:
- The Cambridge Handbook of Age and Ageing
- Published online:
- 05 June 2016
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- 01 December 2005, pp xii-xvi
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Relationship Between Microstructure, Stress and Hardness in Multilayer Coatings.
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1762-1763
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- August 2005
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Fatal Void Size Comparisons in Via-Below and Via-Above Cu Dual-Damascene Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 812 / 2004
- Published online by Cambridge University Press:
- 17 March 2011, F7.6
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- 2004
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Length Effects on the Reliability of Dual-Damascene Cu Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 716 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, B13.3
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- 2002
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Experimental Characterization of the Reliability of 3-Terminal Dual-Damascene Copper Interconnect Trees
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- Journal:
- MRS Online Proceedings Library Archive / Volume 716 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, B8.13
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- 2002
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Test of A Diamond-Tungsten Sampling Calorimeter
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- Journal:
- MRS Online Proceedings Library Archive / Volume 339 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 121
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- 1994
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Correlations Between Electrical and Material Properties of CVD Diamond
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- Journal:
- MRS Online Proceedings Library Archive / Volume 339 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 589
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- 1994
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Electrical Properties of Natural Iia Diamonds Using Photo- and Particle Excitation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 302 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 245
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- 1993
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