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Correlations Between Electrical and Material Properties of CVD Diamond

  • C. White (a1), S. Zhao (a1), K. K. Gan (a1), H. Kagan (a1), R. Kass (a1), R. Malchow (a1), F. Morrow (a1), W. Palmer (a1), S. Han (a2), D. Kania (a2), L. S. Pan (a1), S. Schnetzer (a3), R. Stone (a3), R. Teserek (a3), J. Angus (a4), S. J. Ma (a4) and Y. Sugimoto (a5)...

Abstract

The electrical properties associated with diamond charged particle- and photo-detectors were studied using charged particle-induced conductivity (CPIC) and photo-induced conductivity (PIC). The collection distance d, the product of the excess carrier mobility μ excess carrier lifetime T and electric field E, was used to characterize the diamonds. X-ray diffraction, Raman spectroscopy, photoluminescence, SEM and TEM were performed on CVD diamond detectors to investigate the limitations of the electrical properties. Correlations were found between the electrical properties and the material characterizations.

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1 Current address: Colorado State University, Fort Collins, CO 80523
2Current address: Los Alamos National Lab, Los Alamos, NM 87545

References

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Correlations Between Electrical and Material Properties of CVD Diamond

  • C. White (a1), S. Zhao (a1), K. K. Gan (a1), H. Kagan (a1), R. Kass (a1), R. Malchow (a1), F. Morrow (a1), W. Palmer (a1), S. Han (a2), D. Kania (a2), L. S. Pan (a1), S. Schnetzer (a3), R. Stone (a3), R. Teserek (a3), J. Angus (a4), S. J. Ma (a4) and Y. Sugimoto (a5)...

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