6 results
Low-Cost Direct Electron Detection in the SEM for EBSD and ECCI
-
- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 998-999
- Print publication:
- August 2021
-
- Article
-
- You have access
- Export citation
Simulating Thermal Noise for S/TEM Images from Atom Coordinate Data
-
- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 210-211
- Print publication:
- August 2019
-
- Article
-
- You have access
- Export citation
Dynamical Diffraction S/TEM Simulations from Molecular Dynamics Data
-
- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 208-209
- Print publication:
- August 2018
-
- Article
-
- You have access
- Export citation
Investigating Defect Contrast in GeXSh1-x/Si Epitaxial Structures Using Electron Channeling Contrast Imaging
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 574-575
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Automated Acquisition and Analysis of Selected Area Electron Channeling Patterns in an FEG-SEM
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 550-551
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Diamond Field-Effect Transistors
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 339 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 109
- Print publication:
- 1994
-
- Article
- Export citation