6 results
Direct Mapping of Confined Interfacial States in Oxides Using Aberration Corrected STEM and EELS
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1394-1395
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- July 2010
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Al2O3 Nanopore Sensors for Single Molecule DNA Detection
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- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1662-1663
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- July 2010
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Probing Asymmetric Interfaces of LaMnO3 / SrMnO3 Superlattices with Aberration-Corrected Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 18-19
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- August 2008
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Modeling Electron Diffraction and Imaging in Microscopes with Aberration Correctors for Quantitative Materials Structural Analysis
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 920-921
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- August 2008
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Electron Microscopy of Nanodevices: In Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 188-189
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- August 2008
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Development of Time Resolved Reflection High-Energy Electron Diffraction System to Study Ultrafast Phases Transition at Surfaces
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- Journal:
- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 502-503
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- August 2008
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