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Electron Microscopy of Nanodevices: In Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes

Published online by Cambridge University Press:  03 August 2008

JM Zuo ,
T Kim ,
Q Chen ,
LM Peng  and
EA Olson
JM Zuo
Affiliation:
University of Illinois, Urbana-Champaign
T Kim
Affiliation:
University of Illinois, Urbana-Champaign
Q Chen
Affiliation:
Peking University, P R China
LM Peng
Affiliation:
Peking University, P R China
EA Olson
Affiliation:
University of Illinois, Urbana-Champaign
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 188 - 189
Copyright
© 2008 Microscopy Society of America

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