4 results
A scheme to correct for inaccuracies in the compositional analysis of SixGe1-x by Atom Probe Tomography
-
- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 178-179
- Print publication:
- August 2021
-
- Article
-
- You have access
- Export citation
Stoichiometric analysis of superficial Ba doped Strontium Titanium Oxide layers using APT: the case of the missing Oxygen!
-
- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 2480-2481
- Print publication:
- August 2021
-
- Article
-
- You have access
- Export citation
Influence of Process Parameters on Resistive Switching in MOCVD NiO Films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1337 / 2011
- Published online by Cambridge University Press:
- 27 July 2011, mrss11-1337-q07-09
- Print publication:
- 2011
-
- Article
- Export citation
Thermally-Stable High Effective Work Function TaCN and Ta2N Films for pMOS Metal Gate Applications
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 1073 / 2008
- Published online by Cambridge University Press:
- 01 February 2011, 1073-H01-08
- Print publication:
- 2008
-
- Article
- Export citation