7 results
ADF-STEM Imaging of Dopants and Defect Nanoclusters in Si
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 06 August 2003, pp. 22-23
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- August 2003
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Exploring the physical limits of transistor scaling using STEM
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 01 August 2003, pp. 1012-1013
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- August 2003
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Quantitative atomic-scale profiles of oxygen vacancies in SrTiO3
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 06 August 2003, pp. 110-111
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- August 2003
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Z-Contrast Imaging of Nanostructures in the STEM
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 19 July 2003, pp. 264-265
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- August 2003
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Artificial Charge Modulations in La-doped SrTiO3 Superlattices
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 576-577
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- August 2002
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Imaging Single Dopant Atoms and Nanoclusters in Highly n-type Bulk Si
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1614-1615
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- August 2002
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Environmental Optimization for Sub-0.2NM Scanning Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 110-111
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- August 2000
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