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Exploiting the in-situ Electrical X-ray Microscopy for Semiconductor Nano Devices Analysis by X-ray Nanoprobe Beamline at Taiwan Photon Source
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S2 / August 2018
- Published online by Cambridge University Press:
- 10 August 2018, pp. 430-431
- Print publication:
- August 2018
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Exploring the relationships between information technology adoption and business process reengineering
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- Journal:
- Journal of Management & Organization / Volume 15 / Issue 2 / May 2009
- Published online by Cambridge University Press:
- 02 February 2015, pp. 170-185
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