2 results
Characterization of Metal-Ferroelectric-Metal-Insulator-Semiconductor (MFMIS) FETs Using (Sr,Sm)0.8Bi2.2Ta2O9 (SSBT) Thin Films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 784 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, C9.8/E9.8
- Print publication:
- 2003
-
- Article
- Export citation
Characterization of Metal-Ferroelectric-Metal-Insulator-Semiconductor (MFMIS) FETs Using (Sr,Sm)0.8Bi2.2Ta2O9 (SSBT) Thin Films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 786 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E9.8/C9.8
- Print publication:
- 2003
-
- Article
- Export citation