12 results
Removing Elastic Scattering Effects from Chemical Maps Taken under Incoherent Conditions
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1235-1236
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- August 2015
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One Million EEL Spectra Acquisition with Aberration-Corrected STEM: 2-D Chemical Investigation of a Statistically Significant Ensemble of Nanocatalysts
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 104-105
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- July 2010
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Atomic-Scale EELS Maps: It’s Not Resolution, But Contrast
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 242-243
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- July 2010
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Determining Resolution in an Aberration-Corrected Era: Why Your Probe Is Larger Than You Thought
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 152-153
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- July 2010
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Extending the Depth of Field in Aberration-Corrected STEM by 3D Sectioning
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1838-1839
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- July 2010
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Spectroscopic Imaging of a Statistically Significant Ensemble of Pt-Co Nanoparticles by Aberration Corrected STEM
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 1760-1761
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- July 2010
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Prospects for Reliable 3D Imaging in Aberration-corrected STEM, TEM and SCEM
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1474-1475
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- July 2009
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Electron Channeling Artifacts in Silicon [211] Using Aberration-Corrected STEM
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
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- 26 July 2009, pp. 1492-1493
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- July 2009
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Measurements of Porous Networks in Low-k Dielectric by Three-dimensional Electron Tomography
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1240-1241
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- July 2009
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Aberration-Corrected STEM Imaging and 2-D Elemental-Resolved Valence-EELS Mapping of Ru-TaN Ultrathin Barrier Layer
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1198-1199
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- July 2009
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Controlling Channeling Effects in Aberration-Corrected STEM Tomography
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 926-927
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- August 2008
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Depth Sectioning of Individual Dopant Atoms with Aberration-Corrected Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 884-885
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- August 2007
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