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Extending the Depth of Field in Aberration-Corrected STEM by 3D Sectioning

Published online by Cambridge University Press:  01 August 2010

R Hovden ,
HL Xin  and
DA Muller
R Hovden
Affiliation:
Cornell University
HL Xin
Affiliation:
Cornell University
DA Muller
Affiliation:
Cornell University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1838 - 1839
Copyright
Copyright © Microscopy Society of America 2010