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Structural and Electrical Properties of HfO2 Films Grown by Atomic Layer Deposition on Si, Ge, GaAs and GaN
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- Journal:
- MRS Online Proceedings Library Archive / Volume 786 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, E6.14
- Print publication:
- 2003
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- Article
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Characterisation of Nanocrystals by Scanning Capacitance Force Microscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 738 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, G5.1
- Print publication:
- 2002
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- Article
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