3 results
Using Cathodoluminescence from Continuous and Pulsed-Mode SEM to Elucidate the Nanostructure of Hybrid Halide Perovskite Materials
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- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2006-2008
- Print publication:
- August 2022
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You Do What in Your Microprobe?! The EPMA as a Multimode Platform for Nitride Semiconductor Characterization
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- Journal:
- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 2026-2027
- Print publication:
- August 2018
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Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1024-1025
- Print publication:
- August 2014
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