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Thin Film Porosity Determined by X-Rays at SEM
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1707-1708
- Print publication:
- August 2015
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Measurement of Carbon Layer Thickness with EPMA and the Thin Film Analysis Software STRATAGem
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 96-97
- Print publication:
- September 2007
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