Hostname: page-component-77c89778f8-gq7q9 Total loading time: 0 Render date: 2024-07-17T10:55:04.407Z Has data issue: false hasContentIssue false
  • English
  • Français

Thin Film Porosity Determined by X-Rays at SEM

Published online by Cambridge University Press:  23 September 2015

E. Ortel ,
R. Kraehnert ,
F. Galbert  and
V.-D. Hodoroaba
E. Ortel
Affiliation:
BAM Federal Institute for Materials Research and Testing, Berlin, Germany
R. Kraehnert
Affiliation:
Technical University of Berlin, Berlin, Germany
F. Galbert
Affiliation:
Technical University of Berlin, Berlin, Germany
V.-D. Hodoroaba
Affiliation:
BAM Federal Institute for Materials Research and Testing, Berlin, Germany

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1707 - 1708
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Stratagem version 2.6, SAMx, 4, rue Galilee, 78280 Guyancourt, France.Google Scholar
[2] Pouchou, J.-L., Mikrochim Acta 138 (2002). p 133.Google Scholar
[3] Hodoroaba, V.-D., et al., Surf. Interface Anal. 44 (2012). p 1459.Google Scholar
[4] Procop, M., et al., Anal. Bioanal. Chem. 374 (2002). p 631.Google Scholar
[5] Galbert, F., Microsc. Microanal. 13(Suppl. 3 (2007) 96.Google Scholar
[6] Ortel, E., et al., Small 8 (2012). p 298.Google Scholar