9 results
In Situ Real-Time Studies of Oxygen Incorporation in Complex Oxide Thin Films Using Spectroscopic Ellipsometry and Ion Scattering and Recoil Spectrometry
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- Journal:
- MRS Online Proceedings Library Archive / Volume 619 / 2000
- Published online by Cambridge University Press:
- 10 February 2011, 141
- Print publication:
- 2000
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Studies of Silicon Oxynitride Films Produced by Radio-Frequency Plasma Assisted Electron Cyclotron Resonance
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- Journal:
- MRS Online Proceedings Library Archive / Volume 648 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, P6.2
- Print publication:
- 2000
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In Situ Study of Barrier Layers Using Spectroscopic Ellipsometry and Mass Spectroscopy of Recoiled Ions
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- Journal:
- MRS Online Proceedings Library Archive / Volume 619 / 2000
- Published online by Cambridge University Press:
- 10 February 2011, 135
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- 2000
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In-situ real time studies of nickel silicide formation
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- Journal:
- MRS Online Proceedings Library Archive / Volume 569 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 121
- Print publication:
- 1999
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Combined Spectroscopic Ellipsometry and Ion Beam Surface Analysis for In-Situ Real-Time Characterization of Complex Oxide Film Growth
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- Journal:
- MRS Online Proceedings Library Archive / Volume 569 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 15
- Print publication:
- 1999
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Fowler-Nordheim Tunneling Current Oscillation Study of Interface Roughness
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- Journal:
- MRS Online Proceedings Library Archive / Volume 567 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 221
- Print publication:
- 1999
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In-Situ Real-Time Ellipsometry Study of Dynamic Processes of YBa2Cu3O7−x Thin Films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 569 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 77
- Print publication:
- 1999
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In Situ Ellipsometry in Microelectronics
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- Journal:
- MRS Bulletin / Volume 20 / Issue 5 / May 1995
- Published online by Cambridge University Press:
- 29 November 2013, pp. 24-28
- Print publication:
- May 1995
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Pre-Oxidation Anneal Kinetics: Interface Degradation of Thin SIO2 Films on Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 259 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 93
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- 1992
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