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Plastic deformation processes in Cu/Sn bimetallic films
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- Journal:
- Journal of Materials Research / Volume 23 / Issue 11 / November 2008
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2916-2934
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- November 2008
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Monitoring and Controlling of Strain During MOCVD of AlGaN for UV Optoelectronics
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- Journal:
- Materials Research Society Internet Journal of Nitride Semiconductor Research / Volume 4 / Issue S1 / 1999
- Published online by Cambridge University Press:
- 13 June 2014, pp. 811-816
- Print publication:
- 1999
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In Situ Measurements of Stress Relaxation During Strained Layer Heteroepitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 583 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 167
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- 1999
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Monitoring and Controlling of Strain During Mocvd of AlGaN for UV Optoelectronics
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- Journal:
- MRS Online Proceedings Library Archive / Volume 537 / 1998
- Published online by Cambridge University Press:
- 15 February 2011, G7.7
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- 1998
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Evolution of Surface Roughness During CVD Growth
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- Journal:
- MRS Online Proceedings Library Archive / Volume 440 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 157
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- 1996
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Measurements Of Stress Evolution During Thin Film Deposition
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- Journal:
- MRS Online Proceedings Library Archive / Volume 428 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 499
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- 1996
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Measurements of Stress Evolution During Thin Film Deposition
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- Journal:
- MRS Online Proceedings Library Archive / Volume 436 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 417
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- 1996
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Sputter Roughening Instability on the Ge(001) Surface: Energy and Flux Dependence
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- Journal:
- MRS Online Proceedings Library Archive / Volume 396 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 143
- Print publication:
- 1995
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Real Time Measurement of Epilayer Strain Using a Simplified Wafer Curvature Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 405 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 381
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- 1995
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Smoothing During Ion-Assisted Growth by Transient Ion Beam-Induced Defects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 388 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 349
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- 1995
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Real Time Measurement of Epilayer Strain Using a Simplified Wafer Curvature Technique
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- Journal:
- MRS Online Proceedings Library Archive / Volume 406 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 491
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- 1995
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Energetic Ion Beams in Semiconductor Processing: Summary of a Doe Panel Study
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- Journal:
- MRS Online Proceedings Library Archive / Volume 396 / 1995
- Published online by Cambridge University Press:
- 21 February 2011, 859
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- 1995
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Non-Destructive Characterization of Porous Silicon Using X-Ray Reflectivity
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- Journal:
- MRS Online Proceedings Library Archive / Volume 358 / 1994
- Published online by Cambridge University Press:
- 28 February 2011, 321
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- 1994
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Kinetics of Surface Roughening and Smoothing During Ion Sputtering
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- Journal:
- MRS Online Proceedings Library Archive / Volume 317 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 91
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- 1993
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Intra-Cascade Surface Recombination of Point Defects During Ion Bombardment of Ge (001)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 316 / 1993
- Published online by Cambridge University Press:
- 22 February 2011, 993
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- 1993
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Ion-Assisted Surface Processing of Electronic Materials
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- Journal:
- MRS Bulletin / Volume 17 / Issue 6 / June 1992
- Published online by Cambridge University Press:
- 29 November 2013, pp. 52-57
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- June 1992
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Interface Roughness: What is it and How is it Measured?
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- Journal:
- MRS Online Proceedings Library Archive / Volume 280 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 203
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- 1992
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Mass Flow and Stability of Nanoscale Features on AU(111)
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- Journal:
- MRS Online Proceedings Library Archive / Volume 280 / 1992
- Published online by Cambridge University Press:
- 25 February 2011, 37
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- 1992
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Simulations of Low-Energy Ion Bombardment and Epitaxial Growth
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- Journal:
- MRS Online Proceedings Library Archive / Volume 235 / 1991
- Published online by Cambridge University Press:
- 28 February 2011, 743
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- 1991
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Ge Surface Displacements Due to Low Energy Particles
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- Journal:
- MRS Online Proceedings Library Archive / Volume 236 / 1991
- Published online by Cambridge University Press:
- 25 February 2011, 235
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- 1991
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