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In-Situ Dual-Wavelength Ellipsometry and Light Scattering Monitoring of Si/Si1−xGex Heterostructures and Multiuantum Wells
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- Journal:
- MRS Online Proceedings Library Archive / Volume 324 / 1993
- Published online by Cambridge University Press:
- 22 February 2011, 53
- Print publication:
- 1993
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Interpretation of Uv Reflectance Measurements on Silicon-On-Sapphire By Spectral Reflectance and Spectroscopic Ellipsometry Studies
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- Journal:
- MRS Online Proceedings Library Archive / Volume 53 / 1985
- Published online by Cambridge University Press:
- 28 February 2011, 317
- Print publication:
- 1985
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- Article
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