3 results
Characterization of a Mo Diffusion Barrier for Au/Sn Solder Bonding of Micro/Optoelectronic Devices to Carriers
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1292-1293
- Print publication:
- August 2002
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TEM Microstructure Examination of Weld HAZ in Microalloyed Steels
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 1252-1253
- Print publication:
- August 2002
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Microstructural characterization of porous thin films
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- Journal:
- MRS Online Proceedings Library Archive / Volume 749 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, W5.4
- Print publication:
- 2002
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