8 results
The Caltech-Jodrell Bank VLBI Surveys
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- Journal:
- International Astronomical Union Colloquium / Volume 164 / 1998
- Published online by Cambridge University Press:
- 12 April 2016, pp. 17-24
- Print publication:
- 1998
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Stress-Voiding and Electromigration in Multilevel Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 391 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 411
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- 1995
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The Effect of Cluster Interactions on Electromigration Induced Stress Evolution in Confined Metal Lines
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- Journal:
- MRS Online Proceedings Library Archive / Volume 391 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 197
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- 1995
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Stress-Voiding and Electromigration in Multilevel Interconnect Metallizations
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- Journal:
- MRS Online Proceedings Library Archive / Volume 337 / 1994
- Published online by Cambridge University Press:
- 25 February 2011, 527
- Print publication:
- 1994
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Predicting and Comparing Electromigration Failure for Different Test Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 338 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 435
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- 1994
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The Effect of Thermally Induced Stresses on Electromigration Lifetime Of Near-Bamboo Interconnects
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- Journal:
- MRS Online Proceedings Library Archive / Volume 309 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 121
- Print publication:
- 1993
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Analysis of Thermal Stress Induced Void Growth During Thermal Cycling
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- Journal:
- MRS Online Proceedings Library Archive / Volume 308 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 291
- Print publication:
- 1993
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Analysis of Thermal Stress Induced Void Growth During Thermal Cycling
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- Journal:
- MRS Online Proceedings Library Archive / Volume 309 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 223
- Print publication:
- 1993
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