1 results
Trap Charge Density at Interfaces of MOCVD Pt(Ir)/PZT/Ir(Ti/SiO2/Si) Structures
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 902 / 2005
- Published online by Cambridge University Press:
- 26 February 2011, 0902-T10-27
- Print publication:
- 2005
-
- Article
- Export citation