9 results
The Contribution of Thermally Scattered Electrons to Atomic Resolution Elemental Maps
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1172-1173
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- August 2013
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Chemical Mapping at the Atomic Level using Energy Dispersive X-ray Spectroscopy
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 598-599
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- July 2011
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On the Performance of XEDS and EELS in the AEM: 25 Years Later
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 590-591
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- July 2011
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Comparison of the Detection Limits of EDS and EELS in S/TEM
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1312-1313
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- July 2010
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Thickness Effects in High-angle Annular Dark-field Imaging of Interfaces
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1360-1361
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- August 2006
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Characterization of Bi1.5ZnNb1.5O7-x Pyrochlore Thin Films by High-angle Annular Dark-field Imaging in STEM
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1732-1733
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- August 2005
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Characterization of Epitaxial Semimetallic ErAs Particles in an In0.53Ga0.47As Matrix by High-Angle Annular Dark-Field Imaging
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1456-1457
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- August 2005
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Composition control of radio-frequency magnetron sputter-deposited La0.5Sr0.5CoO3−∂ thin films
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- Journal of Materials Research / Volume 18 / Issue 1 / January 2003
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- 31 January 2011, pp. 188-194
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- January 2003
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Electron Energy-Loss Spectroscopy of Alternative Gate Dielectric Stacks
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- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 November 2002, pp. 66-67
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- August 2002
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