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Application of the UHREM Technique in Atomic Modelling of Growth Defects in CVD-Diamond Films
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 186-187
- Print publication:
- August 2002
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High-resolution electron microscopy investigations of stacking faults in Y1Ba2Cu3O7−δ metalorganic chemical vapor deposited thin films
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- Journal:
- Journal of Materials Research / Volume 14 / Issue 7 / July 1999
- Published online by Cambridge University Press:
- 31 January 2011, pp. 2732-2738
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- July 1999
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High Resolution Electron Microscopy of A Nicl2 – Intercalated Graphite
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- Journal:
- MRS Online Proceedings Library Archive / Volume 20 / 1982
- Published online by Cambridge University Press:
- 15 February 2011, 33
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- 1982
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