12 results
Atomic Resolution Probing of Phase Transformations and Domain Evolution During Large Superelastic Deformation in Ferroelectrics with in situ TEM
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1850-1851
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- August 2019
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Four Dimensional Scanning Transmission Electron Microscopy during the in situ Annealing of a CuZrAl Bulk Metallic Glass
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- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1470-1471
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- August 2019
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Deformation localization in metallic glasses studied by in situ TEM deformation
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1820-1821
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- August 2018
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In situ Nanobeam Electron Diffraction of Bulk Metallic Glasses
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 206-207
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- August 2018
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In situ Strain Mapping of Planar Slip in 304 Stainless Steel
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 736-737
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- July 2017
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Exploring the structural and electronic properties of nanowires at their mechanical limits
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1520-1521
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- July 2017
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Nanoscale Strain Mapping During in situ Deformation of Annealed Al-Mg Alloys
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 522-523
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- July 2016
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Local strain measurements during in situ TEM deformation with nanobeam electron diffraction
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 710-711
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- July 2016
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Development of Diffraction Scanning Techniques for Beam Sensitive Polymers.
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 492-493
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- July 2016
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Quantitative Structural Analysis of Complex Materials by Scanning Nanobeam Diffraction
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- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 502-503
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- July 2016
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Strain Mapping during In-situ Deformation using a High-Speed Electron Detector
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2325-2326
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- August 2015
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Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1046-1047
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- August 2014
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