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Near-interface Traps in n-type SiO2/SiC MOS Capacitors from Energy-resolved CCDLTS
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1246 / 2010
- Published online by Cambridge University Press:
- 01 February 2011, 1246-B09-02
- Print publication:
- 2010
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- Article
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