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Application of Atom Probe on Fully Depleted Silicon-On-Insulator (FDSOI) Structures
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 696-697
- Print publication:
- July 2016
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Atom-Probe-Tomographic Studies on Silicon-Based Semiconductor Devices
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- Journal:
- Microscopy Today / Volume 20 / Issue 5 / September 2012
- Published online by Cambridge University Press:
- 05 September 2012, pp. 38-44
- Print publication:
- September 2012
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