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Recent studies of oxide-semiconductor heterostructures using aberration-corrected scanning transmission electron microscopy
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- Journal:
- Journal of Materials Research / Volume 32 / Issue 5 / 14 March 2017
- Published online by Cambridge University Press:
- 01 August 2016, pp. 912-920
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- 14 March 2017
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Cross-Sectional Characterization of SrTiO3/Si(001) Interfaces using Aberration-Corrected STEM
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1305-1306
- Print publication:
- August 2015
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