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Cross-Sectional Characterization of SrTiO3/Si(001) Interfaces using Aberration-Corrected STEM

Published online by Cambridge University Press:  23 September 2015

HsinWei Wu ,
Toshihiro Aoki ,
Agham B. Posadas ,
Alexander A. Demkov  and
David J. Smith
HsinWei Wu
Affiliation:
School of Engineering for Matter, Transport, and Energy, Arizona State University, Tempe, AZ 85287
Toshihiro Aoki
Affiliation:
LeRoy Eyring Center for Solid State Science, Arizona State University, Tempe, AZ, 85287
Agham B. Posadas
Affiliation:
Department of Physics, The University of Texas at Austin, Austin, TX 78712
Alexander A. Demkov
Affiliation:
Department of Physics, The University of Texas at Austin, Austin, TX 78712
David J. Smith
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ, 85287

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1305 - 1306
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Hao, J.H., et al., Appl. Phys. Lett. 87 (2005) 131908.CrossRefGoogle Scholar
[2] Ji, L., et al., Nat. Nanotechnol. 10 (2015) 84.CrossRefGoogle Scholar
[3] This work was supported by AFOSR Contract FA 9550-12-10494. We gratefully acknowledge the use of facilities within the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University..Google Scholar