6 results
Latest applications of ToF-SIMS characterization for next-generation electronic materials
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 990-991
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
Imaging Atomically Thin Transition Metal Dichalcogenides Using Deep Ultraviolet Photoelectron Emission Microscopy
-
- Journal:
- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 766-767
- Print publication:
- August 2022
-
- Article
-
- You have access
- Export citation
Photoemission Electron Microscopy as a New Tool to Study the Electronic Properties of 2D Crystals and Inhomogeneous Semiconductors
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1504-1505
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Characterization of 2D MoS2 and WS2 Dispersed in Organic Solvents for Composite Applications
-
- Journal:
- MRS Advances / Volume 1 / Issue 32 / 2016
- Published online by Cambridge University Press:
- 29 July 2016, pp. 2303-2308
- Print publication:
- 2016
-
- Article
- Export citation
Effects of Synthesis Parameters on CVD Molybdenum Disulfide Growth
-
- Journal:
- MRS Advances / Volume 1 / Issue 32 / 2016
- Published online by Cambridge University Press:
- 04 July 2016, pp. 2291-2296
- Print publication:
- 2016
-
- Article
-
- You have access
- Export citation
Contributors
-
-
- Book:
- Case Studies in Neuroanesthesia and Neurocritical Care
- Published online:
- 03 May 2011
- Print publication:
- 03 February 2011, pp x-xvi
-
- Chapter
- Export citation