8 results
Progression of Focused Helium Ion Beam Milling in Gold Substrates
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1979-1980
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- August 2015
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Focused Helium Ion Beam Nanomachining of Thin Membranes vs. Bulk Substrates
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 336-337
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- August 2014
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Helium Ion Nanomachining in Membranes and Bulk Substrates
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 910-911
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- August 2013
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A Study of Helium Ion Beam Substrate Interaction Volume on Nanomachining Profiles in Bulk Substrates and Thin Film Membranes
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 808-809
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- July 2012
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Barrier Material Improvement in AlGaN/GaN Microwave Transistors Under Gamma Irradiation Treatment
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- Journal:
- MRS Online Proceedings Library Archive / Volume 764 / 2003
- Published online by Cambridge University Press:
- 01 February 2011, C3.31
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- 2003
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Radiation hardness of AlGaN/GaN based HEMTs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 719 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, F5.4
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- 2002
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Spectroscopic Investigation of Traps Producing Current Collapse In AlGaN/GaN Hemt Structures
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- Journal:
- MRS Online Proceedings Library Archive / Volume 680 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, E5.2
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- 2001
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A Complete Instrumental System for Energy Dispersive Diffractometry and Fluorescence Analysis
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- Journal:
- Advances in X-ray Analysis / Volume 15 / 1971
- Published online by Cambridge University Press:
- 06 March 2019, pp. 254-265
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- 1971
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