Hostname: page-component-76fb5796d-wq484 Total loading time: 0 Render date: 2024-04-26T08:44:55.883Z Has data issue: false hasContentIssue false

A Complete Instrumental System for Energy Dispersive Diffractometry and Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

G.W. Martin
Affiliation:
Stanford Center for Materials Research Stanford University, Stanford, California 94305
A.S. Klein
Affiliation:
Nuclear Equipment Corporation San Carlos, California 94070
Get access

Abstract

A system, has been designed and tested for rapid energy dispersive diffractometry and simultaneous fluorescence analysis. A turntable composed of the sample chamber with attached air-cooled x-ray tube allows the 2θ angle to be varied with respect to the stationary Si(Li) detector. Data for most analyses can be obtained in one minute per sample. Results are stored in the memory of a multichannel analyzer and are read out on a CRT, strip chart recorder or tabulated in digital format by a computer.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1971

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

(l) Moulding, F. S. and Jaklevic, J. M. “Trace Element AnaLysis “by X-ray Fluorescence” University of California Publication UCRL-202625 May 1971.Google Scholar
(2) Giessen, B. C. and Gordon, G. C.X-ray Diffraction: New High Speed Technique based on X-ray SpectrophotographScience Volume 159 1968, Page 973.Google Scholar
(3) Langheinrich, A. P., Forster, J. W. and Tuddenham, W. M.Recent Applications of Energy Dispersion X-ray SpectrometryPaper presented at 1969 Northwest Regional Meeting of the American Chemical Society, Salt lake City, Utah June 1969.Google Scholar
(4) Giessen, B. C. and Gordon, G. C.Recent Developments in Spectrometric Powder DiffractometryNorelco Reporter Volume 17, No. 2, 1970, Page 19.Google Scholar
(5) Fitzgerald, R. and Gantzel, P. “X-ray Energy Spectrometry in the 0.1-10 A Range” American Society for Testing and Materials, Special Technical Publication No.485, 1971.Google Scholar
(6) Jones, W. B. and Carpenter, R. A. “Nondispersive X-ray Fluorescence Spectrometer” Advances in X-ray Analysis, Volume 11 Pages 214229 edited by Newkirk, J. B., Mallett, G. R. and Fay, J..Google Scholar
(7) Johnson, G. G. Jr. and White, E. W. “X-ray Emission Wavelengths and keV Tables for Nondiffractive Analysis” ASTM. Data Series D546, April 1970.Google Scholar
(8) Langheinrich, A. P., Forster, J. W., Linn, T. A. Jr. “Energy Dispersion X-ray (EDX) Analysis in the Non-Ferrous Mining Industry” Paper presented at the ISA AID National Symposium Houston, Texas, April 1971.Google Scholar