7 results
Progression of Focused Helium Ion Beam Milling in Gold Substrates
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1979-1980
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- August 2015
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Focused Helium Ion Beam Nanomachining of Thin Membranes vs. Bulk Substrates
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 336-337
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- August 2014
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Helium Ion Nanomachining in Membranes and Bulk Substrates
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 910-911
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- August 2013
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Widening the Window of Particle Beam Technology: Helium Ion Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 802-803
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- July 2012
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A Study of Helium Ion Beam Substrate Interaction Volume on Nanomachining Profiles in Bulk Substrates and Thin Film Membranes
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 808-809
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- July 2012
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SEM Image Sharpness Analysis1
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- Journal:
- Microscopy Today / Volume 4 / Issue 8 / October 1996
- Published online by Cambridge University Press:
- 14 March 2018, pp. 18-19
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- October 1996
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The Bright Future of Digital Imaging in Scanning Electron Microscopy
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- Journal:
- Microscopy Today / Volume 2 / Issue 4 / July 1994
- Published online by Cambridge University Press:
- 14 March 2018, pp. 19-20
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- July 1994
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