5 results
Mapping Anti-phase Domains by Polarity Sensitive Orientation Imaging Using Electron Backscatter Diffraction
-
- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1522-1523
- Print publication:
- July 2017
-
- Article
-
- You have access
- Export citation
Analysis of Dislocation Densities using High Resolution Electron Backscatter Diffraction
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1891-1892
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
High-Resolution Electron Backscatter Diffraction in III-Nitride Semiconductors
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2217-2218
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Characterization of Elastic Strain Field and Geometrically Necessary Dislocation Distribution in Stress Corrosion Cracking of 316 Stainless Steels by Transmission Kikuchi Diffraction
-
- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 605-606
- Print publication:
- August 2015
-
- Article
-
- You have access
- Export citation
Electron Channeling Contrast Imaging of Defects in III-Nitride Semiconductors
-
- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1024-1025
- Print publication:
- August 2014
-
- Article
-
- You have access
- Export citation